Beilstein J. Nanotechnol.2018,9, 2032–2039, doi:10.3762/bjnano.9.192
mobility.
Keywords: four-point probes; Hall effect; metrology; mobility; variableProbePitch; Introduction
Materials characterization becomes increasingly difficult as the dimensions of transistors continue to decrease. Although three dimensional electrical characterization is the ultimate goal of
the exact distance between the probe and the insulating boundary. To this end, different measurement strategies have been described using micro four-point probes [4][9][10][11]. Most recently, a strategy based on variableprobepitch measurements using a multi-point probe with different subsets of
four electrodes has been developed [11][12]. Similar strategies using variableprobepitch multi-point probes have been used for other systems, including current-in-plane tunneling measurements [13], junction-leakage measurements [14] and surface-conductivity measurements of bulk materials [15][16].
In
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Figure 1:
The standard probe pin configurations A, A’, B and B’ used in the experiments.